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Journal Articles

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    • Dammann, Michael, Leuther, Arnulf, Quay, Rüdiger, Meng, M., Konstanzer, Helmer
      Reliability of 70 nm metamorphic HEMTs
      2004 Microelectronics reliability, Elsevier BV, volume: 44, issue: 6, page: 939-943

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    Book chapters

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      Conference papers

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